摘 要
近幾年來，軟性電子元件具有靈活性和高度整合性的優點而備受關注。該技術已朝著人性化技術的方向發展並考慮了方便使用，便利攜帶，感知，穿戴以及與周圍環境的智能通訊之相關應用。可撓性是軟性電子元件具有的機械特性。因此，分析軟性基板的變形將會是可拉伸電子裝置是一項挑戰。在本研究中，提出了一種在不同的扭轉角度和疲勞試驗條件下對聚對苯二甲酸乙二酯基板的扭轉行為進行分析的方法，探討了不同長寬比例和材質的基板之變形。另外，在本研究中，使用光纖光柵傳感器來測量聚對苯二甲酸乙二酯基板的表面應變。最後，從動態疲勞測試下，探討不同基板上的應變與測試週期數之間的關係並判斷基板是否產生永久變形。
關鍵詞：軟性電子、疲勞測試、氧化銦錫薄膜、聚對苯二甲酸乙二醇酯基板、扭轉Abstract
Flexible electronic devices have attracted great attention due to their advantages of both flexibility and multi-level integration in recent years. The technology has been progressing towards human-friendly technology which considers ease of use, portability, human sensibility, wearing sensation, and smart communication with surrounding environments. Mechanical flexibility is the remarkable characteristic of flexible electronic devices. It is therefore a challenge to analyze the deformation of polyethylene terephthalate (PET) substrates subjected by pure torsion suitable for stretchable device applications. In this research, an analytical method for the twisting behavior of PET substrates is proposed under different twisting angles and fatigue test. Different screen ratios and materials of PET substrates were compared, respectively. In addition, the fiber grating sensor was used to measure the surface strain of the PET substrates in this experiment. Finally, experimental results show the relationship between the strain and number of test cycle on the different substrates during dynamic fatigue test to determine the permanent deformation.
Keywords: Flexible Electronics, Fatigue Test, Indium tin oxide, Polyethylene terephthalate, Twisting